SCANNING ELECTRON MICROSCOPY (SEM)

SCANNING ELECTRON MICROSCOPE (SEM)

Facility Details Model: EVO 10 Make: ZEISS, Germany

Instrument Specifications

• Magnification Range: Up to 500,000×

• Resolution: o3 nm @ 30 kVo8 nm @ 3 kV

• EDS-System: Xplore 30 EDS detector (Oxford Instruments)

• Detectors Available:

• Secondary Electron (SE) Detector

• Backscattered Electron (BSE) Detector   EDS

Key Features of NPTCS

• Working Hours: 9:30 AM to 6:00 PM

• Fast and accurate analysis

• Expertise in failure analysis and result interpretation

• Reliable support from experienced technical professionals

Capabilities

• High-resolution surface morphology imaging

• Elemental and chemical composition analysis at pinpoint locations

• Suitable for both conductive and nonconductive materials  

Typical Uses

• Fractography and failure analysis

• Particle analysis

• Milipore Test Paper Scan for Particle size and particle identification

• Micro-level chemical composition analysis

• Defect and surface evaluation Applications / Suitable Industries

• Metal and non-metal industries

• Ceramic industries

• Polymer, plastic, and rubber industries

• Biomedical applications (dental materials and implants)

• Electronic and semiconductor industries

• General material characterization and research